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-
- #include <SdFatTestSuite.h>
- static uint16_t failCount;
- static uint16_t testCount;
- static Print* testOut = &Serial;
-
- static size_t strlenPGM(PGM_P str) {
- PGM_P end = str;
- while (pgm_read_byte(end++)) {}
- return end - str;
- }
-
- void testBegin() {
- Serial.begin(9600);
- while (!Serial) {}
- testOut = &Serial;
- Serial.println(F("Type any character to begin."));
- while (Serial.read() <= 0) {}
- delay(200);
-
- testOut->print(F("FreeRam: "));
- testOut->println(FreeRam());
- testOut->println();
- failCount = 0;
- testCount = 0;
- }
-
- void testEnd() {
- testOut->println();
- testOut->println(F("Compiled: " __DATE__ " " __TIME__));
- testOut->print(F("FreeRam: "));
- testOut->println(FreeRam());
- testOut->print(F("Test count: "));
- testOut->println(testCount);
- testOut->print(F("Fail count: "));
- testOut->println(failCount);
- }
-
- static void testResult(bool b, uint8_t n) {
- while (n++ < 60) testOut->write(' ');
- if (b) {
- testOut->println(F("..ok"));
- } else {
- testOut->println(F("FAIL"));
- failCount++;
- }
- testCount++;
- }
-
- void testVerify_P(char* result, PGM_P expect) {
- testOut->write('"');
- testOut->print(result);
- testOut->print("\",\"");
- testOut->print((const __FlashStringHelper*)expect);
- testOut->write('"');
- uint8_t n = strlen(result) + strlenPGM(expect) + 5;
- testResult(!strcmp_P(result, expect), n);
- }
-
- void testVerify_P(bool b, PGM_P msg) {
- testOut->print((const __FlashStringHelper*)msg);
- uint8_t n = strlenPGM(msg);
- testResult(b, n);
- }
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